Specialist Suppliers to the European Semiconductor
Industry
Image:HMS-3000 system
Ecopia offer
a range of compact bench top design Hall Effect measurement systems. The compact design and low cost makes
this the ideal R&D lab or university tool for measuring the Hall Effect. Here are some of the features of
the HMS-3000 model;
Measures the resistivity, carrier concentration and mobility of
semiconductors
I/V Curve plotting capability
Windows Software
Five stage current ranges
Provides bulk/sheet carrier concentration, mobility, Hall coefficient, bulk
resistivity, conductivity, magneto resistance and Alpha (Vertical/Horizontal ratio of
resistance)
0.37T, 0.55T & 1.0T flux density
Measurement materials include: Si,SiGe, SiC, GaAs, InGaAs, InP,GaN ( N type & P
type ) etc.
Measurement Temperature 300K, 77K
(LN2)
Spring Clip sample board (no need to solder contacts)
Sample size from 6mm to 20mm
Image: HMS-5000 System
The HMS-5000 Hall Effect Measurement System has automated magnet
movement, with variable temperature capability and powerful analysis software. The system is automated so
that without user intervention, it will ramp to each user defined temperature, stabilize, make the
measurement (including moving the magnet automatically), and then plot a variety of temperature dependent
material properties.
The system plots concentration versus temperature, mobility versus
temperature, resistivity versus temperature, conductivity versus temperature, and Hall coefficient versus
temperature. The systems provides the test results as tabular data as well as in graph form. The user defines the
desired temperature steps within the range of 80K to 350K, fills the two LN2 reservoirs, and then the system
automatically applies and switches the input current, measures the voltages, changes temperature, and moves the
magnets all without user intervention. Once the test is finished, all of the temperature dependent graphs and
tabular data are ready for viewing.
The systems can be used to characterize various materials including all
semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers,
oxides, etc. Sample testing can be performed to demonstrate the system's capability.
Test with variable temperature from 80K up to 350K
Motor controlled magnet moves automatically
Testing of Temperature vs carrier density, mobility,resistivity, hall
coefficient, conductivity, etc.
Easy to use with powerful results capability
Very competitive price The Ecopia HMS-5000 variable Temperature (80K to 350K)
system offers all of the above features with the enhanced capability of the increased variable
temperature range.
For a detailed data sheet on the Ecopia Hall Effect measurement
systems, please click on the link below;