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Celadon Systems Inc, based in Burnsville, Minnesota, is a
worldwide leader in high performance probing solutions for monitoring DC parameters of semiconductor devices at
the wafer level. Celadon focuses on the probe card which makes the electrical contact with the wafer, the card
holder, cabling and interfaces to the semiconductor test system.
Celadon holds many international patents and has solved major industry
problems such as:
- Probe card crash resistance
- Ultra Low leakage
- Fast Settling time
- Simplified reliable interconnects
- Multi-Site high temperature burn in
- Wafer matched thermal expansion probe cards
- Multi-Site probe card in ceramic probing technologies
Celadon are the technology leader in providing Multi-Site probing
solutions which operate over a standard temperature range from -65°C to +300°C. Their products are ideally matched
to customers in semiconductor R&D labs, or wafer fab production, who wish to monitor wafer level reliability
(WLR) of transistors, circuits or semiconductor process characteristics.
Celadon' s range of probe cards are the ideal compliment to our range of
Signatone probe stations. To access the full range of products and services available from Celadon, please click on
the following link's;
T200/300 WLR
series probe cards 
Celadon
Versatile

T40AF series probe
cards 
T40AFIC series
probe cards 
T40LL series probe
cards

T40LLIC series probe
cards
T72 series
probe cards
Versatile &
MiniTile probe cards 
AttoFastT &
Coaxial Probes 
or visit the website at;
Celadon
Systems
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