Quad Map   

High Speed Semi-Automatic Production Resistivity Test Station 

• High speed measurements of thin films, wafers and solar tiles. 
• Reports sheet resistance Ω per square and resisitivity in Ω per cm. 
• Available in 150mm, 156mm square, 200mm and 300mm configurations 
• Speed: 50 points per minute with standard configuration 
• Dual configuration: applies the standard ## to automatically correct for geometric errors caused by probe spacing and/or edge proximity, improving overall accuracy  
• Autorange: finds the ideal current setting to meet the parameters of the standard for measuring. 
• Standard range: 1mΩ to 100MΩ per square 
• P/N typing 
• 5 different 2D and 3D mapping versions to choose from 
• Data is automatically stored and may be exported to a spread sheet. 
• Optional SECSII/GEM interface allows control and ability to upload data from FAB management system