The Ecopia HMS-2000 and HMS-3000 Hall Measurement Systems are complete systems for measuring the resistivity, carrier concentration, and mobility of semiconductors. The HMS-3000 includes software with I-V curve capability. The systems can be used to characterize various material including silicon and compound semiconductors at room temperature or 77K (liquid nitrogen temperature)

Comparison of HMS-3000 with HMS-2000 (18K Excel file).
Characteristics
Compact Desktop Model - Permanent magnets and a small circuit system are used instead of an electric magnet system and a bulky constant current source, producing a compact, desktop design.
Simplicity and Accuracy

• 5 Stage current ranges reduce the allowance error to a minimum Simple Operation - Speedy Data Results.

Main Body (HMS-2000)	Main Body (HMS-3000)

• Data is input by a simple operation providing bulk/sheet carrier concentration, mobility, Hall coefficient, bulk resistivity, conductivity, magnetoresistrance, and alpha (Vertical/Horizontal ratio of resistance).

• Constant current source supply system
• Sample measurement case
• Permanent magnet set
• Hall Effect Measurement Program (Windows)
• Funnel for liquid nitrogen
• 
  Features
• Low and high resistivity measurement capability, bulk and sheet carrier concentration and mobility, Hall coefficient in semiconductors
• DC measurement modes
• van der Pauw and Hall Bar measurements
• Board system (room temperature or 77K)
  
  Specifications:
  General
• Maximum sample size (Small board) - 6mm x 6mm, (Large Board) - 20mm x 20mm.
• Measurement Temperature: 300K (room temperature), 77K (Liquid Nitrogen)
• Cool-down time: 10sec.
• Measurement Material: All semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured).
  Data input of depth enables comprehensive measurement of the whole material.
  
• Resistivity Range of HMS-2000: 10^-4 to 10⁷ (Ohms-cm)
• Magnet: Permanent magnet (diameter: 30 mm)
• Magnet Flux Density: 0.51 Tesla nominal +/-1% of marked value (Optional 1 Tesla sample kit for 300K testing only)
• Stability: 2% over 1 years
• Uniformity: +/- 1% over 20mm diameter from center
• Pole Gap: 26 mm
• Hall voltage limit of 2000mV
• Mobility: (cm²/Volt-sec) 2 ~ 10⁷ (including low temperature)
• Density (cm^-3): 10⁷ ~ 10²¹
• Standard field strength 0.51 Tesla, Optional field strengths 0.27T, 0.31T, 0.37T, 1.0 Tesla (300K testing only).
• Size (W × D × H): 320 x 300 x 105 mm (Constant Current Supply System)
• Weight: 7.7kg (without shipping packaging)
• Packed in overseas wooden crate, Weight: 18.5 Kg, Dimensions: 23" x 18" x 19"
  
  Current source:
• Range: (HMS-3000) 1nA-20mA, (HMS-2000) 10nA-20mA
• Compliance: 12V
  
  Voltage measurements:
• Input impedance: 2x10⁷
• Input voltage range: +/-12V
  
• Sample input: Sample board
  

1. For use with <6mm x 6mm samples (5 pcs included with HMS system)
2. For use with <20mm x 20mm samples (5 pcs included with HMS system)
3. For use with socketed IC's (not normally included, but available upon request)
    Click photo to see a larger image

Left:

Screen-shot showing HMS-3000Software

Click photo to see a larger image

Right:

Screen-shot showing IV Curve software

Click photo to see a larger image

Downloadable documents and information regarding the Hall Measurement System:

1)  A four page flyer regarding the HMS-3000 a 258kb PDF file  -

2)  A pictorial step-by-step guide to using the HMS-2000 in automatic mode [1.4 Meg Excel doc]

3)  Operating Manual for the HMS-3000 System [1.3M MEG PDF file]

4)  HMS EC.doc - Tables that show 1) ELECTRIC CHARACTERISTICS DEPENDENT ON INPUT CURRENT and 2) CHARACTERISTICS OF GaAs SAMPLE DEPENDENT ON THE CHANGE OF MAGNETIC FLUX DENSITY, using the HMS-3000 sytem.

5)  An NIST web page, http://www.eeel.nist.gov/812/hall.html, regarding the theory and implementation of the Hall Effect Measurement technique

                                                                                                                      Return to main Product page>