Wafer Probing Product Suite
Signatone’s CM-350 Semiautomated On Wafer
300mm Probing Systems
with ambient to 300°C
temperature probing
capability. Wide variety of
application use:
C-V/I-V, RF/mmW and
MEMS configurations. A full
range of probing accessories
compliment the range.
Signatone’s WL-350-LE Semiautomated On Wafer Probing
300mm Systems with -65ºC to
300°C temperature probing
with EMI/RFI/Light shielding
capability. Wide variety of
application use:
C-V/I-V, RF/mmW and MEMS
configurations. A full range of
probing accessories compliment
the range.
Signatone’s WL-310-LE
Manual On Wafer Probing
Systems with -65°C to 300°C
temperature probing with
EMI/RFI/Light shielding
capability. Wide variety of
application use:
C-V/I-V, RF/mmW and
MEMS configurations. A full
range of probing accessories
compliment the range.
Signatone’s PowerPro
power device
characterization system
enables safe and accurate
over temperature, low
contact resistance
measurements of power
semiconductors up to 3 kV
(Triax) / 10 kV (Coax).
All PowerPro chucks are
specifically designed for safe
high power and low noise
measurement in ambient or
at-temperature operation.
Signatone’s CM-210 high
precision 200mm manual On
Wafer Probing System with
ambient to 300°C temperature
probing capability. Wide
variety of application use:
C-V/I-V, RF/mmW and MEMS
configurations. A full range of
probing accessories
compliment the range.
Signatone’s WL-1160 high
precision 200mm manual
On Wafer Probing System
with ambient to 300°C
temperature probing
capability. Wide variety of
application use:
C-V/I-V, RF/mmW and
MEMS configurations. A full
range of probing accessories
compliment the range