Device Characterisation Product Suite
Signatone’s QuadPro 2 Automated sheet resistivity measurement systems for laboratory, research, and small productions. Measures V/I, Sheet Resistance, Resistivity or Thickness Reports Average, Standard Deviation, Minimum, Maximum and 1 Sigma for the data set Temperature Coefficient of Resistance (TCR) measurements integrated with automated temperature chuck and source meter (Optional), Automated 2D Colour Contour mapping, 3D and Cross section mapping employs the Dual Configuration Testing method for improved accuracy and repeatability, tests samples 10mm to 300mm, P/N Typing, Comparative Mapping.
Signatone’s Pro4 Manual sheet resistivity measurement systems. The stand includes several features to ensure accurate resistivity measurements. The system is used to characterize materials made by semiconductor doping, metal deposition, resistive paste printing, glass coating…The software manages the tests, displays results and allows printouts or export of the data. The user inputs the size and shape of the sample, edge exclusion and number of points to be tested. The user may also define pass/fail criteria and which parameter (Rs, Resistivity, or V/I) to display. Upon completion of testing all points, the average, standard deviation, minimum and maximum are prominently displayed. Upon completion, a summary report may be printed showing the data and pass/fail status.
Signatone’s ΩPro is a diagnostic multi-test measurement system. Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes. Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
Ecopia offer a range of compact designed Hall Effect measurement systems for measuring the resistivity, carrier concentration, P/N type, and mobility of various materials including semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, oxides, etc., at both 300K and 77K. The Ecopia system includes software with I-V curve capability to check the ohmic contact of the sample and alpha (Vertical/Horizontal ratio of resistance).
GigaTest Labs are the industry’s leading signal integrity company. The probe station ranges are designed for RF and fine pitch large area board probing and a rotation probing platform. The systems are a unique combination of precision and flexibility, and are indispensable when used in conjunction with a TDR scope, VNA, or oscilloscope for measurements. Gigatest Labs furthermore offer a full range of RF micropositioners and single and dual RF probe heads. 3 types of calibration substrate are also available.
GGB Industries Inc. the creator of the Picoprobe® range of microwave and oscilloscope probes has supported the on-wafer probing requirements of the global semiconductor industry since 1980. The company transformed on-wafer microwave probing with the introduction of a patented coaxial microwave probe featuring 50Ω coplanar flexible tips. The launch of a high-performance W-band mmW probe further established the company as a global leader in microwave probe technology. Over the years, the operating frequencies of its coaxial probes have been extended to 145 GHz, while its waveguide probes now reach up to 1.1 THz.