Celadon Systems
Inc, based in Burnsville, Minnesota, is a worldwide leader in high performance probing
solutions for monitoring DC parameters of semiconductor devices at the wafer level. Celadon focuses on
the probe card which makes the electrical contact with the wafer, the card holder, cabling and interfaces
to the semiconductor test system.
Celadon holds many international patents and
has solved major industry problems such as:
- Probe card crash resistance
- Ultra Low leakage
- Fast Settling time
- Simplified reliable
interconnects
- Multi-Site high temperature burn
in
- Wafer matched thermal expansion probe
cards
- Multi-Site probe card in ceramic probing
technologies
Celadon are the technology leader in
providing Multi-Site probing solutions which operate over a standard temperature range from -65°C to +300°C. Their
products are ideally matched to customers in semiconductor R&D labs, or wafer fab production, who wish to
monitor wafer level reliability (WLR) of transistors, circuits or semiconductor process
characteristics.
Celadon' s range of probe cards are the
ideal compliment to our range of Signatone probe stations. To access the full range of products and services
available from Celadon, please click on the following link's;
T200/300 WLR series probe
cards

Celadon
Versatile

T40AF series probe cards

T40AFIC series probe cards

T40LL series probe cards

T40LLIC
series probe cards
T72 series probe cards
Versatile & MiniTile probe
cards 
AttoFastT & Coaxial Probes

or visit the
website at;
Celadon Systems
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